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Physical analysis of high-intensity focusing x-ray optics: doubly curved crystals vs. highly focusing polycapillaries [4781-10]

Formica, S. Lee, S. M.; MacDonald, C. A.

Proceedings of SPIE, the International Society for Optical Engineering.; Advances in laboratory-based x-ray sources and optics; Seattle, WA, 2002; Jul, 2002, 77-86 -- SPIE; 2002 (pages 77-86) -- 2002

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Physical analysis of high-intensity focusing x-ray optics: doubly curved crystals vs. highly focusing polycapillaries (4781-10)

Formica, S. Lee, S. M.; MacDonald, C. A.

International Society for Optical Engineering; 1999 (pages 77-86) -- 2002

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Ultrathin metals and nano-structuring for photonic applications (Invited Paper) [8982-17]

Formica, N. et al.

Proceedings of SPIE, the International Society for Optical Engineering. VOL 8982, ; 2014, 8982 0I -- International Society for Optical Engineering; 1999 Part; -- 2014

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Polycapillary optic-enhanced x-ray diffraction and fluorescence for rapid materials analysis (Invited Paper) [5918-10]

Schmidt, J.; Formica, S. P.; Lee, S. M.

Proceedings of SPIE, the International Society for Optical Engineering.; Laser-generated, synchrotron and other laboratory X-ray and EUV sources, optics and applications II; San Diego, CA, 2005; Aug, 2005, 591809 -- SPIE; c2005 -- 2005

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An in situ XRF system for composition mapping of thin film IR sensors [5726-02]

Formica, S. P. et al.

Proceedings of SPIE, the International Society for Optical Engineering. VOL 5726, ; 2005, 1-9 -- International Society for Optical Engineering; 1999 (pages 1-9) -- 2005

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An in situ XRF system for composition mapping of thin film IR sensors [5726-02]

Formica, S. P.; Lee, S. M.

Proceedings of SPIE, the International Society for Optical Engineering.; Semiconductor photodetectors II; San Jose, CA, 2005; Jan, 2005, 1-9 -- SPIE; 2005 (pages 1-9) -- 2005

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X-ray reflectivity: a new metrology alternative for DUV ARCs [5041-19]

Agnihotri, D. et al.

Proceedings of SPIE, the International Society for Optical Engineering.; Process and materials characterization and diagnostics in IC manufacturing; Santa Clara, CA, 2003; Feb, 2003, 149-154 -- SPIE; 2003 (pages 149-154) -- 2003

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8
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Characterization of laser micromachining of metals [5650-36]

McMahon, P. J. et al.

Proceedings of SPIE, the International Society for Optical Engineering.; Micro- and nanotechnology: materials, processes, packaging, and systems; Micro- and nanotechnology: materials, processes, packaging, and systems II /; Sydney, Australia, 2004; Dec, 2005, 209-218 -- SPIE; 2005 (pages 209-218) -- 2005

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X-ray reflectivity: a new metrology alternative for DUV ARCs [5041-19]

Agnihotri, D. et al.

International Society for Optical Engineering; 1999 (pages 149-154) -- 2003

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10
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Ultrathin metals and nano-structuring for photonic applications (Invited Paper) [8982-17]

Formica, N. et al.

Proceedings of SPIE, the International Society for Optical Engineering.; Optical components and materials XI; San Francisco, CA, 2014; Feb, 2014, 8982 0I -- Bellingham; SPIE; [2014] Part; -- 2014

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by this Author/Contributor:

  1. Formica, S. P.
  2. Lee, S. M.
  3. Formica, C.
  4. Wilson, A. R.
  5. Pruneri, V.

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