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Preprocessing and quality assessment of crosshole georadar data [4084-103]

Tronicke, J. Dietrich, P. Appel, E.; Longstaff, D.

Proceedings of SPIE, the International Society for Optical Engineering.; Ground penetrating radar; Gold Coast, Australia, 2000; May, 2000, 579-583 -- Bellingham, Washington; SPIE; 2000 (pages 579-583) -- 2000

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Aspects of sensitivity analysis for metal detectors [4394-03]

Dietrich, B. A. Sieber, A. J.

International Society for Optical Engineering; 1999 Part: 1; (pages 20-30) -- 2001

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Layer structure of free-standing smectic LC elastomer films [4759-79]

Kohler, R. Dietrich, U. Li, J.-J. Losche, M. Stannarius, R.; Tolksdorf, C. Zentel, R.

International Society for Optical Engineering; 1999 (pages 483-488) -- 2002

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Aspects of sensitivity analysis for metal detectors [4394-03]

Dietrich, B. A. Sieber, A. J.; Dubey, A. C.

Proceedings of SPIE, the International Society for Optical Engineering.; Detection and remediation technologies for mines and minelike targets; Orlando, FL, 2001; Apr, 2001, 20-30 -- SPIE; 2001 (pages 20-30) -- 2001

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Moving to Microvias in a High Reliability, Low Production Environment

Folkerts, J. Falk, P. Dietrich, A. Le, B. Ling, S.

International Society for Optical Engineering; 1999 (pages 052-55) -- 2001

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6
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Development and characterization of a new plasma etching process for mask manufacturing [4409-39]

Erber, F. Ruhl, G. G. Ebi, C. Dietrich, R. Mathuni, J. Nesladek, P.; Kawahira, H.

Proceedings of SPIE, the International Society for Optical Engineering.; Photomask and next-generation lithography mask technology; Yokohama, Japan, 2001; Apr, 2001, 401-408 -- SPIE; 2001 (pages 401-408) -- 2001

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Development and characterization of a new plasma etching process for mask manufacturing [4409-39]

Erber, F. Ruhl, G. G. Ebi, C. Dietrich, R. Mathuni, J. Nesladek, P.; Kawahira, H.

International Society for Optical Engineering; 1999 (pages 401-408) -- 2001

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8
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Layer structure of free-standing smectic LC elastomer films [4759-79]

Kohler, R. Dietrich, U. Li, J.-J. Losche, M. Stannarius, R.; Tolksdorf, C. Zentel, R.; Zielinski, J.

Proceedings of SPIE, the International Society for Optical Engineering.; Liquid crystals: chemistry, physics and applications; Zakopane, Poland, 2001; Sep, 2002, 483-488 -- SPIE; 2002 (pages 483-488) -- 2002

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9
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Multisensor mine signature measurements at the JRC [4038-97]

Fortuny-Guasch, J. Dietrich, B. Hosgood, B. Nesti, G. Dean, J. T.; Sieber, A. J.; Dubey, A. C.

Proceedings of SPIE, the International Society for Optical Engineering.; Detection and remediation technologies for mines and minelike targets; Orlando, FL, 2000; Apr, 2000, 877-885 -- SPIE; 2000 (pages 877-885) -- 2000

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10
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Azimuth axis design for huge telescopes: an update [5495-08]

Karcher, H. J.

Proceedings of SPIE, the International Society for Optical Engineering.; Astronomical structures and mechanisms technology; Glasgow, 2004; Jun, 2004, 67-76 -- SPIE; 2004 Part: Part; (pages 67-76) -- 2004

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