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Local structure change of Rh on alumina after treatments in high-temperature oxidizing and reducing environments

Dohmae, K.; Nonaka, T.; Seno, Y.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films. VOL 37; NUMB 2, ; 2005, 115-119 -- JOHN WILEY & SONS LTD Part: Part 2; (pages 115-119) -- 2005

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Local structure change of Rh on alumina after treatments in high-temperature oxidizing and reducing environments

Dohmae, K.; Nonaka, T.; Seno, Y.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; Atomic level characterizations for new materials and devices; Papers presented at the 4th international symposium on atomic level characterizations for new materials and devices (ALC'03); Kauai, HI, 2003; Oct, 2005, 115-119 -- John Wiley; 2005 Part: Part 2; (pages 115-119) -- 2005

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Real-time XAFS analysis of Rh/alumina catalyst

Dohmae, K. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films. VOL 40; NUMBER 13, ; 2008, 1751-1754 -- John Wiley & Sons, Ltd (pages 1751-1754) -- 2008

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Characterization of Ar ion etching induced damage for GaN

Kataoka, K. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films. VOL 44; NUMBER 6, ; 2012, 709-712 -- John Wiley & Sons, Ltd Part: Part 6; (pages 709-712) -- 2012

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Thickness and coverage determination of multilayer with an island-like overlayer by hard X-ray photoelectron spectroscopy at multiple photon energies

Isomura, N. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films. VOL 47; NUMBER 2, ; 2015, 265-269 -- John Wiley & Sons, Ltd Part 2; (pages 265-269) -- 2015

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by this Author/Contributor:

  1. Dohmae, K.
  2. Nonaka, T.
  3. Seno, Y.
  4. Kataoka, K.
  5. Kimoto, Y.

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