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The Materials Issues for Future ULSIs (Invited)

Asai, S.

INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY SYSTEMS AND APPLICATIONS.; VLSI technology, systems, and applications; Taipei, 1993; May, 1993, 77-81 -- IEEE; 1993 Part: Part 6; (pages 77-81) -- 1993

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The Materials Issues for Future ULSIs (Invited)

Asai, S.

INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY SYSTEMS AND APPLICATIONS.; VLSI technology, systems, and applications; Taipei, 1993; May, 1993, 77-81 -- IEEE; 1993 Part: Part 6; (pages 77-81) -- 1993

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The Materials Issues for Future ULSIs (Invited)

Asai, S.

INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY SYSTEMS AND APPLICATIONS.; VLSI technology, systems, and applications; Taipei, 1993; May, 1993, 77-81 -- IEEE; 1993 Part: Part 6; (pages 77-81) -- 1993

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Anomalous discharging current in polymethylpentene

Asai, S.; Ohki, Y.

Annual report / Conference on Electrical Insulation and Dielectric Phenomena.; Electrical insulation and dielectric phenomena: IEEE 1995 annual report; Virginia Beach; VA, 1995; Oct, 1995, 496-499 -- IEEE; 1995 Part: Part; (pages 496-499) -- 1995

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Anomalous discharging current in polymethylpentene

Asai, S.; Ohki, Y.

Annual report / Conference on Electrical Insulation and Dielectric Phenomena.; Electrical insulation and dielectric phenomena; Virginia Beach; VA, 1995; Oct, 1995, 496-499 -- IEEE; 1995 Part: Part; (pages 496-499) -- 1995

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6
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Superconducting Magnetic Filter: Performance, Recovery, and Design

Eskandarpour, A.; Iwai, K.; Asai, S.

IEEE transactions on applied superconductivity. VOL 19; NUMB 2, ; 2009, 84-95 -- IEEE (pages 84-95) -- 2009

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7
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193 nm Phase-Shifting Lithography with Single Layer Resist for VLSIs Beyond 1 G-bit DRAM

Asai, S. et al.

Digest of technical papers - Symposium on VLSI Technology.; VLSI technology; Honolulu; HI, 1996; Jun, 1996, 182-183 -- IEEE; 1996 Part: Part; (pages 182-183) -- 1996

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8
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Vibration Control of a PUMA Type Robots by H~ì Control

Asai, S. et al.

IEEE INTERNATIONAL WORKSHOP ON ADVANCED MOTION CONTROL.; Advanced motion control; Nagoya; Japan, 1992; Mar, 1992, 424-431 -- IEEE; 1992 Part: Part; (pages 424-431) -- 1992

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A New Variational Method to Determine Effective Channel Length and Series Resistance of MOSFET's

Yamaguchi, K. et al.

PROCEEDINGS OF THE IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES.; Microelectronic test structures; Kanazawa; Japan, 1998; Mar, 1998, 123-126 -- IEEE; 1998 (pages 123-126) -- 1998

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A 65 nm CMOS technology with a high performance and low leakage transistor, a 0.55 mum^2 6T-SRAM cell and robust hybrid-ULK/Cu interconnects for mobile multimedia applications

Nakai, S. et al.

Technical digest / International Electron Devices Meeting.; International electron devices meeting; Washington, DC, 2003 Dec, 0, 285-288 -- IEEE; 2003 (pages 285-288)

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  1. Asai, H.
  2. Asai, T
  3. Asai, K.
  4. Asai, M.
  5. Asai, Y.

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