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Results 1 - 10 of 3,596  for Explore Further

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1
IEEE Standard for Transitions, Pulses, and Related Waveforms (181-2011)
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IEEE Standard for Transitions, Pulses, and Related Waveforms (181-2011)

IEEE Std 181-2011 (Revision of IEEE Std 181-2003)

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2
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505 (1505.1-2008)
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IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505 (1505.1-2008)

IEEE Std 1505.1-2008

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3
IEEE Standard for Documentation Schema for Repair and Assembly of Electronic Devices (1874-2013)
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IEEE Standard for Documentation Schema for Repair and Assembly of Electronic Devices (1874-2013)

IEEE Std 1874-2013

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4
IEEE Standard for Test Access Port and Boundary-Scan Architecture (1149.1-2013)
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IEEE Standard for Test Access Port and Boundary-Scan Architecture (1149.1-2013)

IEEE Std 1149.1-2013 (Revision of IEEE Std 1149.1-2001)

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5
IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device (1687-2014)
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IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device (1687-2014)

IEEE Std 1687-2014

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6
IEEE/IEC International Standard - Design and Verification of Low-Power Integrated Circuits (61523-4-2015)
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Book
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IEEE/IEC International Standard - Design and Verification of Low-Power Integrated Circuits (61523-4-2015)

IEC 61523-4 Edition 1.0 2015-03 (IEEE Std 1801-2013)

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7
IEEE Recommended Practice for Distributed Simulation Engineering and Execution Process Multi-Architecture Overlay (DMAO) (1730.1-2013)
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IEEE Recommended Practice for Distributed Simulation Engineering and Execution Process Multi-Architecture Overlay (DMAO) (1730.1-2013)

IEEE Std 1730.1-2013

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8
IEEE Standard for IEEE Test Procedure for Single-Degree-of-Freedom Spring-Restrained Rate Gyros -- Corrigendum 1: Table 1 Heading (293-1969/Cor 1-2014)
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Book
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IEEE Standard for IEEE Test Procedure for Single-Degree-of-Freedom Spring-Restrained Rate Gyros -- Corrigendum 1: Table 1 Heading (293-1969/Cor 1-2014)

IEEE Std 293-1969/Cor 1-2014 (Corrigendum to IEEE Std 293-1969)

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9
American National Standard Data Format for Radiation Detectors Used for Homeland Security - Redline (N42.42-2012)
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American National Standard Data Format for Radiation Detectors Used for Homeland Security - Redline (N42.42-2012)

ANSI N42.42-2012 (Revision of ANSI N42.42-2006) - Redline

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10
IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture (1149.7-2009)
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IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture (1149.7-2009)

IEEE Std 1149.7-2009

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